Advances in X-Ray Analysis: Volume 39

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Advances in X-Ray Analysis: Volume 39

Advances in X-Ray Analysis: Volume 39

Name: Advances in X-Ray Analysis: Volume 39
ISBN: 9781461553779

J. L. de Vries (auth.), John V. Gilfrich, Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith, Paul K. Predecki (eds.)

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Historical Reviews of X-Ray Science and Technology: The Early Years of X-Ray Diffraction and X-Ray Spectrometry; J.L. de Vries.Conditoningof X-Ray Beams and Other Developments in X-Ray Instrumentation: Application of Graded Multilayer Optics in X-Ray Diffraction; M.Schuster, H. Gobel.Stress and Strain Determination by DiffractionMethods, Peak Broadening Analysis: Actual Tasks of Stress Analysis by Diffraction; V. Hauk.Characterization of Polymers, AmorphousMaterials and Organics by X-Ray Neutron Scattering: Analysis of X-Ray Diffraction Scans of Poorly Crystallized Semicrystalline Polymers; N.S. Murthy.Precision, Accuracy in XRD, Phase Analysis: Results of X-Ray Powder Diffraction Round Robin Tests with Corundum Plates and Powder Samples; V. Valvoda, et al.Characterization of Thin Films byX-Ray Diffraction and Fluorescence: Inhomogeneous Deformation in Thin Films; I.C. Noyan, C.C. Goldsmith.Other Applications of X-RayDiffractions Including High-Temperature and Nonambient: TotalReflection XRF and Trace Analysis: Quantitative ZRF DataInterpretation and Other XRF Applications. 95 Additional Articles. Index.

Κατηγορίες:

Engineering

Έτος:

1998

Εκδότης:

Springer US

Γλώσσα:

english

Σελίδες:

1998

ISBN 10:

1461553776