Scanning Electron Microscopy and X-Ray Microanalysis

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Scanning Electron Microscopy and X-Ray...

Scanning Electron Microscopy and X-Ray Microanalysis

Joseph I. Goldstein & Dale E. Newbury & Joseph R. Michael & Nicholas W.M. Ritchie & John Henry J. Scott & David C. Joy

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Κατηγορίες:

Έτος:

2018

Εκδότης:

Springer

Γλώσσα:

english

Αρχείο:

PDF, 73.49 MB

IPFS:

,

english, 2018

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Ίσως σας ενδιαφέρει

A. J. Tousimis and L. Marton (Eds.) — Electron Probe Microanalysis

Claude Lechene (Eds.) — Microbeam Analysis in Biology

Charles Evans, Richard Brundle, Wilson — Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films (Materials Characterization Series)

C. Richard Brundle; Charles A. Evans, Jr.; Shaun Wilson — Encyclopedia of Materials Characterization

David B. Williams & C. Barry Carter — Transmission Electron Microscopy

Kannan M. Krishnan — Principles of Materials Characterization and Metrology

Bell, David C.; Garratt-Reed, Anthony J — Energy-dispersive X-ray analysis in the electron microscope

David B. Williams, C. Barry Carter — Transmission Electron Microscopy, Part 1

John C. Russ, M. Ashby Frs, R. Kiessling and J. Charles (Auth.) — Fundamentals of Energy Dispersive X-ray Analysis

David Brandon, Wayne D. Kaplan — Microstructural Characterization of Materials

Debbie Stokes — Principles and practice of variable pressure/environmental scanning electron microscopy

Yang Leng — Materials characterization

S. J. B. Reed — Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Charles Evans, Richard Brundle, Wilson — Encyclopedia of Materials Characterization: Surfaces, Interfaces, Thin Films

J. Hutchison, J. Hutchison, A. Kirkland — Nanocharacterisation

M. A. Hayat Ph.D. (eds.) — X-Ray Microanalysis in Biology

Stephen J. Pennycook (auth.), Stephen J. Pennycook, Peter D. Nellist (eds.) — Scanning Transmission Electron Microscopy: Imaging and Analysis

David C. Joy — Helium Ion Microscopy

Mauro Sardela (eds.) — Practical Materials Characterization

H. H. Pattee, V. E. Cosslett and Arne Engström (Eds.) — X-ray Optics and X-ray Microanalysis

Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy — Scanning Electron Microscopy and X-Ray Microanalysis

Luo, Zhiping — A practical guide to transmission electron microscopy. Volume II, : Advanced microscopy

Angus I Kirkland, Sarah J Haigh (eds.) — Nanocharacterisation

DC Bell — Energy-dispersive X-ray analysis in the electron microscope

Prof. Yang Leng(auth.) — Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Second Edition

E. Lifshin (editor) — Characterization of Materials

Professor Dr. Ludwig Reimer (auth.) — Scanning Electron Microscopy: Physics of Image Formation and Microanalysis

Nicolas Brodusch,Hendrix Demers,Raynald Gauvin (auth.) — Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization

Anjam Khursheed — Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope

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